Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Temperature
Reexamination Certificate
2004-09-14
2008-10-21
Ngo, Ngan (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Temperature
C257SE23080, C257SE31131
Reexamination Certificate
active
07439601
ABSTRACT:
Embodiments of the invention include a temperature sensor apparatus, method and system for providing an output voltage response that is linear to the temperature of the integrated circuit to which the temperature sensor belongs and/or the integrated circuit die on which the temperature sensor resides. The output voltage of the temperature sensor has an adjustable gain component and an adjustable voltage offset component that both are adjustable independently based on circuit parameters. The temperature sensor includes a conventional bandgap circuit, which generates an internal PTAT (proportional to absolute temperature) current to produce a bandgap reference voltage, and a current mirror arrangement that provides a scaled current that is proportional to the bandgap circuit's PTAT current. Conventionally, the scaled PTAT current is sourced through an output resistor to provide the output voltage of the temperature sensor. The inventive temperature sensor includes an offset circuit that diverts a portion of current from the scaled PTAT current before the current is sourced through the output resistor. Thus, the inventive temperature sensor subtracts an offset voltage from the output voltage, which offset voltage represents the desired voltage offset component. The offset circuit includes a bandgap circuit arrangement, a voltage to current converter arrangement, and a current mirror arrangement that are configured to provide a voltage offset that is adjustable based on independent circuit parameters such as resistor value ratios and transistor device scaling ratios. The gain component of the inventive temperature also is based on similar independent circuit parameters.
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Pease, Robert A.; “A New Fahrenheit Temperature Sensor”; IEEE Journal of Solid-State Circuits; Dec. 1984; pp. 971-977; vol. SC-19, No. 6; USA.
Meijer, Gerard C. M.; “An IC Temperature Transducer with an Intrinsic Reference”; IEEE Journal of Solid-State Circuits; Jun. 1980; pp. 370-373; vol. SC-15, No. 3; USA.
Agere Systems Inc.
Ngo Ngan
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