Linear hall circuit for measuring magnetic field strength

Electricity: measuring and testing – Magnetic – Magnetometers

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324225, 338 32H, 327511, G01R 3306, G01N 2772

Patent

active

054263646

ABSTRACT:
A linear Hall circuit that utilizes a single-ended output Hall current to sense a magnetic field so as to measure the magnetic field strength. A first operational amplifier configured as a transresistance amplifier converts the output Hall current of a Hall device to an output voltage. To avoid inducing a bias-based nonlinearity in the output Hall current, a second operational amplifier, having two resistors connected to both bias electrodes of the Hall device, respectively, is used to inject feedback Hall currents in them. The average value of the bias currents is then kept from varying with the output Hall current of the Hall device.

REFERENCES:
patent: 3416010 (1968-12-01), Kuehnlein et al.
patent: 4449081 (1984-05-01), Doemen
patent: 4646014 (1987-02-01), Eulenberg
patent: 4823075 (1989-04-01), Alley
James Thompson, Magnetic field Measuring Circuit, European Patent Application 0357013, Mar. 1990.
Chinese Patent Application 90106846.2, Jan. 9, 1991.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Linear hall circuit for measuring magnetic field strength does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Linear hall circuit for measuring magnetic field strength, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Linear hall circuit for measuring magnetic field strength will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1846408

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.