Linear flaw detector

Details Linear flaw detector Linear flaw detector

1978-10-02

1980-01-15

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356446, G01N 2132

Patent

active

041840828

ABSTRACT:
A linear flaw detector for coated surfaces. An incident beam is provided and sensed above and below the theoretical specular angle. Where a flaw occurs, the reflected signal changes in intensity. By sensing above and below the specular angle, the signal corresponding to the flaw is accented in reference to the signals from the background. The signal corresponding to the flaw may then be separated from background noise and an output provided.

REFERENCES:
patent: 3922093 (1975-11-01), Dandliker et al.
patent: 3984189 (1976-10-01), Seki et al.
patent: 4029420 (1977-06-01), Simms

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