Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1991-06-21
1992-12-29
Myracle, Jerry W.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73777, 73780, 307580, G01B 716
Patent
active
051741598
ABSTRACT:
Linear displacement and strain measuring apparatus includes a linearly movable element, an emitter disposed on the movable element to move as the element is moved, for developing predetermined paterns of electric fields which vary linearly on the emitter in the direction of movement of the element, and a detector disposed in close proximity to the emitter adjacent the path in which the emitter moves to detect variations in the electric field patterns as the emitter is moved, for producing output signals representing variation in the electric field patterns and thus the linear displacement of the movable element relative to the detector. By attaching the movable element and the detector to spaced apart locations on a specimen, strain in the specimen can be measured.
REFERENCES:
patent: 4811254 (1989-03-01), Iijima et al.
patent: 4944181 (1990-07-01), Wnuk
Davis Clark C.
Jacobsen Stephen C.
Mladejovsky Michael G.
Myracle Jerry W.
University of Utah Research Foundation
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