Linear array detector system and inspection method

X-ray or gamma ray systems or devices – Specific application – Absorption

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C378S058000, C378S062000, C378S098800, C250S366000

Reexamination Certificate

active

11519271

ABSTRACT:
A linear array detector (LAD) for scanning an object is provided. The detector includes a scintillator layer configured for generating a number of optical signals representative of a fraction of an incident X-ray beam passing through the object. The plane of the scintillator is parallel to the X-ray beam. The LAD further includes a two dimensional array of photo-conversion elements configured to receive several X-rays of the X-ray beams and configured to generate corresponding electrical signals. An arrangement of the photo-conversion elements is independent of the X-ray paths.

REFERENCES:
patent: 4179100 (1979-12-01), Sashin et al.
patent: 4187427 (1980-02-01), Cusano
patent: 4303860 (1981-12-01), Bjorkholm et al.
patent: 4560882 (1985-12-01), Barbaric et al.
patent: 6167110 (2000-12-01), Possin et al.
patent: 6246747 (2001-06-01), Wear et al.
patent: 6546075 (2003-04-01), Chartier et al.
patent: 6740041 (2004-05-01), Faulkner et al.
patent: 3183984 (1991-08-01), None
patent: WO2004/008967 (2004-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Linear array detector system and inspection method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Linear array detector system and inspection method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Linear array detector system and inspection method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3845700

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.