Linear and angular displacement measuring interferometer

Details Linear and angular displacement measuring interferometer Linear and angular displacement measuring interferometer

1988-07-08

1989-11-21

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356358, 356363, G01B 902

Patent

active

048818160

ABSTRACT:
An interferometer system capable of measuring linear displacement and angular displacement simultaneously of a movable plane mirror (90) comprises a source (10) of a frequency stabilized input beam (12) and includes an optical system which reflects one polarization component of the input beam (12) twice from a first position on the movable plane mirror (90) to produce beams (30) and reflects the other polarization component of the input beam twice from a stationary plane mirror (89) to produce beam (28). A polarization beamsplitter (80) recombines these beams (30, 28) into a beam (66) in which the phase difference between the two components of the third output beam (66) is related to four times the linear displacement of the movable plane mirror (90) at the first position. Beam (66) is divided into beams (119) and (121), with the interference between the two polarization components detected by photodetector (94) to produce a signal (96) from which the phase change is extracted (99) to produce a measured phase which is related to four times the linear displacement of the movable plane mirror (90) at the first position. The polarization beamsplitter (80) and a retroreflector (81) reflect one polarization component of the other beam (121) twice from a second position on the movable plane mirror (90) and reflect the other polarization component of this beam (121) twice from the stationary plane mirror (89) with the beamsplitter (80) recombining the resultant beams into a beam (67) having two orthogonally polarized components in which the phase difference between the two components of the beam is related to four times the sum of the linear displacements of the movable plane mirror (90) at the first and second positions. The interference between the two components of beam (67) is detected by second photo detector (194) to produce a signal (97) for indicating a second measured phase, which is related to four times the sum of the linear displacement of the movable plane mirror (90) at the first and second positions. Electronic module (124) provides the difference between one-half of the second measured phase (101) and the first measured phase (100) to produce a signal (126) related to angular displacement (91) of the movable plane mirror (90).

REFERENCES:
patent: 4746216 (1988-05-01), Sommargren
patent: 4752133 (1988-06-01), Sommargren
patent: 4807997 (1989-02-01), Sommargren

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