Line tracing method and apparatus utilizing non-linear...

Electricity: measuring and testing – Conductor identification or location – Inaccessible

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S533000, C324S534000, C324S535000

Reexamination Certificate

active

07808226

ABSTRACT:
A method, device, and apparatus for tracing a conductive line and locating any concealed surveillance devices coupled to the line uses a signal generator to produce a test signal having a fundamental frequency which is coupled to the line under test. The test signal flowing through the line under test creates electromagnetic waves that propagate through the atmosphere away from the line. A portable locator probe is used to detect the radiated signal and thus the conductive line by detecting the magnitude of the radiated signal. As the locator probe is moved closer to the line, the amplitude of the detected signal increases. In addition, the portable locator probe detects harmonic signals radiated from nonlinear junctions coupled to the line at harmonic frequencies of the fundamental test signal. By examining the relative strengths of the second and third harmonic signals, a user can determine if the detected non-linear junction is being produced by a semiconductor or a corrosive/dissimilar metal type non-linear junction. A DC bias voltage can be used to improve the responses of any semiconductor based non-linear junctions. Any semiconductor junctions located with the probe are manually examined to determine the cause of the non-linear junction.

REFERENCES:
patent: 3299351 (1967-01-01), Williams
patent: 3631484 (1971-12-01), Augenblick
patent: 3733545 (1973-05-01), Elsner et al.
patent: 4053891 (1977-10-01), Opitz
patent: 4063229 (1977-12-01), Welsh et al.
patent: 4123749 (1978-10-01), Hartmann et al.
patent: 4331957 (1982-05-01), Enander et al.
patent: 4413254 (1983-11-01), Pinneo et al.
patent: 4439769 (1984-03-01), Masak
patent: 4471344 (1984-09-01), Williams
patent: 4547724 (1985-10-01), Beazley et al.
patent: 4586048 (1986-04-01), Downie
patent: 4595915 (1986-06-01), Close
patent: 4700179 (1987-10-01), Fancher
patent: 5191343 (1993-03-01), Danzer et al.
patent: 5414410 (1995-05-01), Davies et al.
patent: 5557283 (1996-09-01), Sheen et al.
patent: 5881132 (1999-03-01), O'Brien et al.
patent: 5990791 (1999-11-01), Endreasen et al.
patent: 5994905 (1999-11-01), Franchville
patent: 6057765 (2000-05-01), Jones et al.
patent: 6097798 (2000-08-01), Albers et al.
patent: 6163259 (2000-12-01), Barsumian et al.
patent: 6177801 (2001-01-01), Chong
patent: 6765527 (2004-07-01), Jablonski et al.
patent: 6897777 (2005-05-01), Holmes et al.
patent: 6934655 (2005-08-01), Jones et al.
patent: 2004/0036478 (2004-02-01), Logvinov et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Line tracing method and apparatus utilizing non-linear... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Line tracing method and apparatus utilizing non-linear..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Line tracing method and apparatus utilizing non-linear... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4188879

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.