Line scan and X-ray map enhancement of SEM X-ray data

Details Line scan and X-ray map enhancement of SEM X-ray data Line scan and X-ray map enhancement of SEM X-ray data

1979-01-11

1981-02-24

Wise, Edward J.

Boots, shoes, and leggings

250311, 358111, 364515, 368118, G06F 1520

Patent

active

042531543

ABSTRACT:
An improved method and apparatus for obtaining and displaying SEM X-ray line scans and maps for data collection and presentation in energy dispersive X-ray analysis of materials, having ratemeter circuitry providing a voltage output proportional to the intensity of detected pulses in an energy window and an absolute digital representation of the intensity count rate both corrected for dead time, input multiplexing and multiple output buffering of the ratemeter to accomodate multiple channel signals, a feedback loop from said ratemeter to provide display image enhancement, inhibit circuitry to eliminate background signals, signal averging circuitry to permit storage of multiple line scan of multiple single channel analyser outputs in a multi-channel analyser for later processing and display circuitry for displaying stored line scans.

REFERENCES:
patent: 3578960 (1971-05-01), Georgi et al.
patent: 3812288 (1974-05-01), Walsh
patent: 3813545 (1974-05-01), Barnhart
patent: 3842347 (1974-10-01), Terbrack
patent: 3887870 (1975-06-01), Grosseau
patent: 3936741 (1976-02-01), Coulter et al.
patent: 3938038 (1976-02-01), Campbell
patent: 3968431 (1976-07-01), Ekstrom
patent: 3988602 (1976-10-01), Gorsica, Jr.
patent: 4011502 (1977-03-01), Fraser
patent: 4068310 (1978-01-01), Friauf
patent: 4156914 (1979-05-01), Westell

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