Data processing: measuring – calibrating – or testing – Calibration or correction system – Circuit tuning
Reexamination Certificate
2011-03-15
2011-03-15
Schechter, Andrew (Department: 2857)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Circuit tuning
C702S106000, C324S601000
Reexamination Certificate
active
07908107
ABSTRACT:
A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set of potential values in a manner such that the reference reactance errors are reduced.
REFERENCES:
patent: 4989154 (1991-01-01), Yamashita et al.
patent: 5047725 (1991-09-01), Strid et al.
patent: 5442296 (1995-08-01), Schiek et al.
patent: 6023209 (2000-02-01), Faulkner et al.
patent: 6963209 (2005-11-01), Gailus et al.
patent: 7054776 (2006-05-01), Bradley et al.
patent: 7643957 (2010-01-01), Daniel
patent: 2004/0070405 (2004-04-01), Wu et al.
patent: 2007/0040565 (2007-02-01), Jayabalan et al.
Ross A. Speciale, “A Generalization of the TSD Network-Analyzer Calibration Procedure, covering n-Port Scattering-Parameter Measurements, Affected by Leakage Errors,” IEEE Transactions on Microwave Theory and Techniques, vol. MTT-25, No. 12, Dec. 1977, pp. 1100-1115.
Christophe Sequinot, et al., “Multimode TRL—A New Concept in Microwave Measurements: Theory and Experimental Verification,” IEEE Transactions on Microwave Theory and Techniques. vol. 46, No. 5, May 1998, pp. 536-542.
F.M. Ghannouchi, Y. Xu and R.G. Bosisio, “One-step connection method for the measurement of N-port microwave networks using six-port techniques,” IEEE Proc.-Microw. Antennas Propag., vol. 141, No. 4, Aug. 1994, pp. 285-289.
Louis D. Silverstein, et al., “Hybrid spatial-temporal color synthesis and its applications,” Extended version of a combined contribution of three papers presented at the 2005 SID International Symposium held May 24-27, 2005, in Boston, Massachusetts, Copyright 2006, pp. 3-13.
Pierre De Greef, Hendriek Groot Hulze and Seyno Sluyterman, “54.4: Adaptive Dual Pulse Backlight for LCD-TV displays,” SID 06 Digest, pp. 1712-1715.
Boutros, et al., “High Performance Gan HEMTs on 3-inch SI-SIC Substrates” In: The International Conference on Compound Semiconductor Manufacturing Technology. Section 2.3, 2004 [retrieved on Sep. 13, 2009], <http://gaas.org/Digests/2004/2004Papers/2.3.pdf>.
Cascade Microtech, Inc.
Chernoff Vilhauer & McClung & Stenzel
Huynh Phuong
Schechter Andrew
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