Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-02-01
2005-02-01
Patel, Jayanti K. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C250S559080, C348S126000, C356S237600
Reexamination Certificate
active
06850637
ABSTRACT:
An optical inspection system with an improved illumination system. The improved illumination system used to illustrate the invention has a base formed from a printed circuit board. Substrates for mounting lighting elements, which are exemplified by light emitting diodes, are formed also on printed circuit boards. These circuit boards have serrated edges and the diodes are mounted to the serrations. This configuration allows the light emitting elements to be focused on the focal point. Also in the exemplary illumination system, the light emitting elements have different beam widths so that variations in the illumination intensity as a function of elevation angle are reduced.
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Patents Abstracts of Japan; vol. 2000, No. 01; Jan. 31, 2000 & JP 11 295047 A, Oct. 29, 1998; figure 5, col. 4, line 26-line 64.
Model 5511A Automatic Loaded PC Board Inspection SystemBrochure published by Universal Instruments Corporation, dated 1987.
Patel Jayanti K.
Teradyne Legal Dept.
Teradyne, Inc.
Walsh Edmund J.
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