Optics: measuring and testing – Of light reflection – With diffusion
Patent
1994-06-27
1995-10-31
Rosenberger, Richard A.
Optics: measuring and testing
Of light reflection
With diffusion
356226, G01N 2147, G01J 144
Patent
active
054634679
ABSTRACT:
Method of detecting and evaluating analog photometric signals in a test carrier analysis system, and apparatus for carrying out the method. The test field of a test carrier is irradiated by a light source clocked in light-dark phases. The reflected light is detected by a measurement receiver over a measurement period having several light-dark phases, and integrated. An effective suppression of stray and secondary light, which permits measurement even without the hitherto conventional shielding from ambient light, is achieved by a method in which the sequence of the light and dark phases integrated over the measurement period is irregular in such a way that the Fourier-transformed frequency spectrum includes a large number of different frequencies. Each individual frequency therefore makes only a small contribution to the measurement result.
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Baumann Edgar
Obermeier Wolfgang
Werner Karl
Boehringer Mannheim GmbH
Eisenberg Jason D.
Rosenberger Richard A.
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