Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-03-30
1994-12-13
Hille, Rolf
Optics: measuring and testing
By polarized light examination
With light attenuation
356372, 356445, 362440, G01B 1124
Patent
active
053733622
ABSTRACT:
A light source device for measuring shape.
A laser beam emitted by a semiconductor laser is converged by a lens in a direction transverse to the laser junction. The laser beam emerging from the lens is diverged by a diverging means in the direction aligned with the laser junction, and passes through unchanged in the direction transverse to the laser junction.
REFERENCES:
patent: 4875777 (1989-10-01), Harding
patent: 5054926 (1991-10-01), Dabbs et al.
patent: 5243405 (1993-09-01), Tichenor et al.
Iwata Kuniyoshi
Kano Yukio
Hille Rolf
Kabushiki Kaisha Tokai-Rika-Denki-Seisakusho
Tran Minhloan
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