Light scattering property measurement method

Details Light scattering property measurement method Light scattering property measurement method

2008-12-02

2011-10-25

Pham, Hoa (Department: 2886)

Optics: measuring and testing

Of light reflection

C356S446000

Reexamination Certificate

active

08045170

ABSTRACT:
Methods (300, 1000) of determining a light scattering property of a medium (152), are disclosed. The medium (152) is illuminated through a test pattern (e.g.,155, 510), the test pattern (155, 510) comprising at least one region containing a first pattern with substantial variation in two orthogonal directions at one scale. The test pattern (300, 1000) further comprises at least one other region containing the first pattern at a different scale. The light reflected from the illuminated medium (152) through the test pattern is measured to capture an image of the illuminated medium. A light scattering property of the medium (152) is determined based on the measured light.

REFERENCES:
patent: 7440105 (2008-10-01), Adel et al.
patent: 2003/0224261 (2003-12-01), Schulz
patent: 2004/0257571 (2004-12-01), Mieher et al.
patent: 2006/0033921 (2006-02-01), Den Boef et al.
patent: 2006/0066855 (2006-03-01), Boef et al.
Information Technology—Office Equipment—Measurement of Image Quality Attributes for Hardcopy Output—Binary Monochrome Text and Graphic Images, 2001, pp. 1 to 28.

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