Light scanning device

Optical: systems and elements – Deflection using a moving element – Using a periodically moving element

Reexamination Certificate

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Details

C359S204200, C359S206100, C347S259000

Reexamination Certificate

active

07038823

ABSTRACT:
A first fθ lens is arranged to form an inclination angle α1to a main scanning plane. A second fθ lens is arranged to form an inclination angle α2. In order to determine the inclination angles α1and α2, curvature amounts of scanning lines generated on a scanned surface are measured when the fθ lenses are independently inclined one at a time at a minute angle. Change rates K1and K2are obtained from the measured curvature amounts and the minute angles. The inclination angles α1and α2are determined such that |K1α1+K2α2|is no more than a certain value.

REFERENCES:
patent: 5646767 (1997-07-01), Iima et al.
patent: 05-346553 (1993-12-01), None
patent: 09-033842 (1997-02-01), None
patent: 09-274134 (1997-10-01), None

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