Optics: measuring and testing – Photometers – Photoelectric
Patent
1996-12-17
1997-12-02
Pham, Hoa Q.
Optics: measuring and testing
Photometers
Photoelectric
356226, 250368, G01J 142
Patent
active
056942117
ABSTRACT:
When incident light is incident to a photodetector, photoelectrons are emitted and multiplied in each of incident zones whereby a plurality of current signals are output. These current signals each are processed to estimate a distribution or a mean value of numbers of photoelectrons generated in each incident zone. Then estimated based on the estimate values of respective incident zones is the number of photoelectrons emitted from the entire photoelectric conversion surface. In this way the intensity of incident light is measured with accuracy.
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Ohsuka Shinji
Takamoto Hisayoshi
Laboratory of Molecular Biophotonics
Pham Hoa Q.
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