Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system
Reexamination Certificate
2005-08-02
2005-08-02
Le, Que T. (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Optical or pre-photocell system
C250S227150
Reexamination Certificate
active
06924474
ABSTRACT:
A technique is provided in which the inside and outside of an exposure device is prevented from being adversely affected by leakage of light by setting an inspection output most suitable for high-power LD. A light-leakage detection level is set correspondingly to output characteristics of each high-power LD, and respective thresholds thereof are previously stored. As a result, leakage of light can be determined in a lower-power state of 100 mW or less. Accordingly, even if leakage of light may occur, leakage of light can be determined before high-power light leaks, and the inside and outside of the device can be prevented from being adversely affected by light leakage.
REFERENCES:
patent: 4812641 (1989-03-01), Ortiz Jr.
patent: 5104391 (1992-04-01), Ingle et al.
Kato Yoshinori
Kosuge Takaaki
Fuji Photo Film Co. , Ltd.
Le Que T.
Sughrue & Mion, PLLC
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