Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate
2006-11-07
2006-11-07
Pham, Hoa Q. (Department: 2877)
Optics: measuring and testing
By particle light scattering
With photocell detection
C356S343000, C250S251000
Reexamination Certificate
active
07133132
ABSTRACT:
An optical trap and method for measuring both transverse and longitudinal forces on a trapped particle. Laser light sources generate first and second light beams that are focused to the trap region in a counter-propagating manner for trapping the particle. Detectors measure changes in power deflections of the light beams leaving the trap region, and changes in power concentrations of the light beams leaving the trap region. A processor calculates the transverse forces on the particle based upon the measured changes in the power deflections of the light beams, and calculates the longitudinal forces on the particle based upon the measured changes in the power concentrations of the light beams. A single beam optical trap and method are also disclosed, where the second optical beam is generated by a reflection of the first optical beam off of the trapped particle.
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Bustamante Carlos J.
Smith Steven B.
DLA Piper (US) LLP
Pham Hoa Q.
The Regents of the University of California
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