Light-emitting Group IV semiconductor devices

Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction

Reexamination Certificate

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C257S018000, C257S021000, C257S086000, C257S102000

Reexamination Certificate

active

11138925

ABSTRACT:
In one aspect, a semiconductor device includes a p-region and an n-region. The p-region includes a first Group IV semiconductor that has a bandgap and is doped with a p-type dopant, and a first region of local crystal modifications inducing localized strain that increases the bandgap of the first Group IV semiconductor and creates a conduction band energy barrier against transport of electrons across the p-region. The n-region includes a second Group IV semiconductor that has a bandgap and is doped with an n-type dopant, and a second region of local crystal modifications inducing localized strain that increases the bandgap of the second Group IV semiconductor and creates a valence band energy barrier against transport of holes across the n-region.

REFERENCES:
patent: 5012304 (1991-04-01), Kash et al.
patent: 6030266 (2000-02-01), Ida et al.
patent: 6872641 (2005-03-01), Chidambarrao et al.
patent: 2003/0150376 (2003-08-01), Homewood et al.
patent: 2005/0167653 (2005-08-01), Mears et al.
patent: 2006/0270086 (2006-11-01), Rankin et al.
patent: 2007/0069195 (2007-03-01), Park et al.
patent: 1727214 (2006-11-01), None
Kevin P. Homewood et al., “Light from Si via dislocation loops,” Materials Today, pp. 34-39 (Jan. 2005).
G.Z. Pan et al., “(113) Defect-Engineered Silicon Light-Emitting Diodes,” IEDM Tech Digest, pp. 343-346, Dec. (2004).
M. Kittler et al., “Silicon-based light emission after ion implantation,” Optoelectronic Integration on Silicon edited by David J. Robbins et al., Proc. of SPIE vol. 5357, Jul. 2004, pp. 164-171.
M. Milosavlijevic et al., “Engineering of boron-induced dislocation loops for efficient room-temperature silicon light-emitting diodes,” Journal of Applied Physics, vol. 97 (2005).
Z. Yu et al., “GaAs-based heterostructures on Silicon,” 2005 Int'l Conf. on Compund Semiconductor Mfg New Orleans, LA (Apr. 11-14, 2005).
M.A. Lourenco et al., “Ion beam fabricated silicon light emitting diodes,” Phys. Stat. Sol. (a), vol. 201, No. 2 pp. 239-244 (2004).
Maria Eloisa Castagna et al., “High efficiency light emitting devices in silicon,” Materials Science & Engineering B, vol. 105, Elsevier, pp. 83-90 (2003).
Regina Ragan et al., “Direct energy gap group IV semiconductor alloys and quantum dot arrays in SnxGe1-x/Ge and SnxSi1-x/Si alloy systems,” Materials Science & Engineering B, vol. 87, Elsevier, pp. 204-213 (2001).
T. Brunhes et al., “Electroluminescence of Ge/Si self-assembled quantum dots grown by chemical vapor deposition,” Applied Physics Letters, vol. 77, No. 12, pp. 1822-1824 (Sep. 18, 2000).
Philippe M. Fauchet et al., “Progress toward nanoscale silicon light emitters,” IEEE J. of Selected Topics in Quantum Electronics, vol. 4, No. 6, pp. 1020-1028 (Nov.-Dec. 1998).
C. S. Peng et al., “Optical properties of Ge self-organized quantum dots in Si,” Phys. Rev. B. vol. 57, No. 15, pp. 8805-8808 (1998).
G.T. Reed et al., “Erbium-doped silicon and porous silicon for optoelectronics,” Materials Science & Engineering B, vol. 40, pp. 207-215 (1996).

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