Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material
Reexamination Certificate
2011-01-25
2011-01-25
Parker, Kenneth A (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Organic semiconductor material
C257S079000, C257SE51001, C544S353000
Reexamination Certificate
active
07875879
ABSTRACT:
A substrate including a semiconductor layer, where characteristics of an element can be evaluated with high reliability, and an evaluating method thereof are provided. A substrate including a semiconductor layer of the invention has a closed-loop circuit in which an antenna coil and a semiconductor element are connected in series, and a surface of an area over which the circuit is formed is covered with an insulating film. By using such a circuit, a contactless inspection can be carried out. Further, a ring oscillator can be substituted for the closed-loop circuit.
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Kawakami Sachiko
Seo Satoshi
Suzuki Tsunenori
Ho Anthony
Husch Blackwell LLP Welsh & Katz
Parker Kenneth A
Semiconductor Energy Laboratory Co,. Ltd.
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