Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – Plural light emitting devices
Reexamination Certificate
1997-10-28
2001-04-10
Jackson, Jr., Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Incoherent light emitter structure
Plural light emitting devices
C257S094000, C257S098000, C372S050121
Reexamination Certificate
active
06215132
ABSTRACT:
TECHNICAL FIELD
The present invention relates to a light emitting diode with a divided light-emitting region to ensure that a degradation of the light emissivity by dislocations cannot propagate over the whole of this region.
BACKGROUND ART
Light emitting diodes are used as light sources in a variety of technical applications, from simple consumer products to telecommunication with optical fibres. In applications of the latter character, the requirements for the reliability of the light source are very high. Although a certain variation of the luminous intensity with time can be tolerated in digital equipment, where it is essentially sufficient to distinguish between positions when the diode lights up and when the diode does not light up, the decision whether the light source is switched on or off is based on whether its luminous intensity lies above or below a threshold value. If, because of ageing processes, the luminous intensity of the diode approaches this threshold value, equipment where the light emitting diode is included is no longer reliable.
Light emitting diodes may be inflicted with an ageing mechanism which manifests itself in the form of a network of dislocations arising in the light-emitting region of the light emitting diode. The dislocations are initiated at some defect, located in the light-emitting region, in the semiconductor material when the defective material is subjected to high irradiance while at the same time being subjected to mechanical stresses. The dislocation network may propagate in the whole of the light-emitting region whereby the luminous efficiency drops to a fraction of its original value.
Increased knowledge of this ageing mechanism is used when designing and choosing operating parameters which reduce the probability of this degradation of the light emissivity occurring. However, the degradation cannot be completely eliminated.
For very vital functions, redundancy can be created by simultaneously using at least two parallel-connected light emitting diodes. However, the space is often too limited to be able to use several diodes, for example when feeding light into optical fibres where typical cross sections are 20-100 micrometers.
SUMMARY OF THE INVENTION
The basic idea of the invention is to divide the light-emitting region into at least two sub-regions through zones of semiconductor material which do not allow dislocations to propagate between the regions. In height, the light-emitting sub-regions are delimited by layers of materials with a higher energy gap than the light-emitting material both above and below the light-emitting layer. Because of the high energy gap in these layers, these are transparent to the generated light and, therefore, dislocations which are generated by absorbed light cannot propagate into these regions. In the lateral direction, the delimitation occurs with ion-implanted material which is generated by ion bombardment. By this treatment,.the resistance to mechanical deformation, and hence also to propagation of dislocations, increases.
The reduction of the light emissivity is, in this way, limited to a sub-region and the light quantity emitted by the whole diode decreases only in proportion to the sub-region's share of the entire light-emitting region. For example, a light emitting diode with four equal light-emitting sub-regions and a probability P of degradation of such a region after a certain burning time, this the luminous intensity drops to 75% of the original value with the probability P, to 50% of the original value with the probability P
2
, to 25% of the original value with the probability P
3
, and only after the drop-out of all four sub-regions with the probability P
4
does the whole light emitting diode expire. This entails very small probabilities of drop-out of more than one sub-region and hence a very great reliability if the device in which the light emitting diode is used tolerates a reduction of the luminous intensity.
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Nettelbladt Hans
Widman Michael
Jackson, Jr. Jerome
Jenkens & Gilchrist P.C.
Mitel Semiconductor AB
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