Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-12-17
2000-02-08
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324754, 324758, G01R 3100
Patent
active
060231726
ABSTRACT:
A probe card analyzer includes a table or jig for securing a probe card, a light source for producing at least a first beam of collimated light, and at least a first positioning mechanism for positioning the first beam at a predefined desired probe tip location. A second beam of collimated light and a second positioning mechanism may be provided for positioning the second beam such that it intersects the first beam at the desired probe tip location for visually identifying the desired probe tip location. The first and the second beams may be successively adjusted through a set of desired probe tip location coordinates, the position of each of a set of probe tips being adjusted to the respective desired probe tip location, to which point the probe tip may be adjusted.
REFERENCES:
patent: 4777146 (1988-10-01), Bylsma et al.
patent: 5208641 (1993-05-01), Mocker et al.
patent: 5404021 (1995-04-01), Mangano et al.
patent: 5666063 (1997-09-01), Abercrombie et al.
patent: 5735276 (1998-04-01), Lemelson
Ballato Josie
Micro)n Technology, Inc.
Sundaram T. R.
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