Lifecycle support software tool

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation

Reexamination Certificate

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Details

C702S170000

Reexamination Certificate

active

10770672

ABSTRACT:
The invention provides a simulation process and method of utilizing it to time to better estimate when a component of a product is about to fail by tracking varying “environmental factors” related to the severity of conditions to which product is exposed over a period of time. The invention includes the steps of:(a) determining a distribution of mean times between failures or failure rate for each component of the product;(b) using statistical techniques to select a fail point for each component;(c) applying an aging factor for each component for conditions to which the product is subjected; and(d) calculating an estimated time for failure for a component using information comprising time periods the component was subjected to conditions, and aging factors relating to the conditions.

REFERENCES:
patent: 5900735 (1999-05-01), Yamamoto
patent: 6487518 (2002-11-01), Miyazaki et al.
patent: 2003/0078741 (2003-04-01), Storino
patent: 2004/0044499 (2004-03-01), House et al.

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