Data processing: structural design – modeling – simulation – and em – Simulating nonelectrical device or system
Reexamination Certificate
2007-12-04
2007-12-04
Rodriguez, Paul (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating nonelectrical device or system
C703S002000
Reexamination Certificate
active
10493245
ABSTRACT:
To predict a correction rated life at high accuracy. A life predicting device executes step S1, step S2, step S4for inputting specification information including a basic dynamic rated load C and basic static rated load C0, step5for computing a dynamic equivalent load P based on the specification information. step S3for setting a reliability factor a1, step S7and step S8for determining a contact ellipse area S, step S9for inputting a foreign substance purchasing diameter ddebris(“debris” means “foreign substance”), step10for determining a standardized foreign substance diameter (ddebris/√ S), step S11for setting a life correction coefficient axyzbased on the standardized foreign substance diameter, and step S6and step S12for calculating a correction rated life Lnmbased on the reliability coefficient, the life correction coefficient, the basic dynamic rated load and the dynamic equivalent load and the like.
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Matsumoto Youichi
Murakami Yasuo
Urakami Seigou
Kim Eunhee
NSK Ltd.
Rodriguez Paul
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