Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-05-04
2009-12-01
Nguyen, Tan T. (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185030
Reexamination Certificate
active
07626868
ABSTRACT:
Non-Volatile Memory (NVM) cells are connected in inverter configurations. The NVM inverter's Voltage Transfer Characteristics (VTC) is used to verify and adjust threshold voltage levels of a Multi-Level Cell (MLC) in an NVM. In one embodiment, the NVM cell is fast programmed to a specific threshold voltage level. The cell threshold level is then verified by applying a ‘gate voltage corresponding to the selected threshold voltage to the NVM inverter. The output voltage of the NVM inverter in response to the applied level gate voltage is detected. When the output voltage of the NVM inverter is out of a predefined output voltage window for the selected threshold voltage level, a fine-tuning programming sequence is applied to the NVM cell until the threshold voltage of the NVM cell is inside the correspondent threshold voltage window. This verification and adjustment scheme for a MLC NVM allows the threshold voltage of the multi-level NVM cells for any specific level to be controlled to a desired accuracy.
REFERENCES:
patent: 5764568 (1998-06-01), Chevallier
FlashSilicon Incorporation
Haynes and Boone LLP
Nguyen Tan T.
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