Lens device for introducing a second ion beam into a primary...

Details Lens device for introducing a second ion beam into a primary... Lens device for introducing a second ion beam into a primary...

2008-05-13

2008-05-13

Nguyen, Kiet T. (Department: 2881)

Radiant energy

With charged particle beam deflection or focussing

Magnetic lens

C250S285000

Reexamination Certificate

active

11217248

ABSTRACT:
The invention provides a device for introducing ions into the primary ion path of a mass spectrometry system. In general, the device contains an electrical lens having a primary ion passageway and a secondary ion passageway that merges with the primary ion passageway. In certain embodiments, the electrical lens contains a first part and a second part that, together, form the primary ion passageway. The first part of the lens may contain the secondary ion passageway.

REFERENCES:
patent: 5668373 (1997-09-01), Robbat et al.
patent: 6027890 (2000-02-01), Ness et al.
patent: 6469297 (2002-10-01), Kato
patent: 6596989 (2003-07-01), Kato
patent: 6737641 (2004-05-01), Kato
patent: 2003/0141449 (2003-07-01), Wells et al.
patent: 2004/0108455 (2004-06-01), Mordehai

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