Lens arrangement for the focusing of electrically charged partic

Details Lens arrangement for the focusing of electrically charged partic Lens arrangement for the focusing of electrically charged partic

1986-04-29

1988-08-23

Anderson, Bruce C.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

250281, 250396R, H01J 4932

Patent

active

047663146

ABSTRACT:
A lens arrangement (30) for the focusing of a beam of electrically charged particles (24) in the beam path of imaging systems, more particularly in mass spectrometers (10), is indicated, the lens arrangement (30) being connected to an electrical voltage supply. The lens arrangement (30) is situated at the location or in the vicinity of the intermediate image (29) produced by the imaging system, and consists of a plurality of plates (32 to 35) disposed in succession, with aligned transmission apertures (38 to 41), the plates being connected to adjustable electrical voltages.

REFERENCES:
patent: 3138733 (1964-06-01), Smith
patent: 3585384 (1971-06-01), Castaing et al.
patent: 3745343 (1973-07-01), Halliday et al.
patent: 3814936 (1974-06-01), Green
patent: 4418280 (1983-11-01), Matsuda
patent: 4638160 (1987-01-01), Slodzian et al.
"Design and Performance of an Energy-and Angle-Resolved Secondary Ion Mass Spectrometer," by R. A. Gibbs and N. Winograd, 1148-55, Rev. Sci. Instrum. 52(8), Aug. 1981.

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