Lens arrangement for the focusing of electrically charged partic

Radiant energy – Ionic separation or analysis – Static field-type ion path-bending selecting means

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250281, 250396R, H01J 4932

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active

047663146

ABSTRACT:
A lens arrangement (30) for the focusing of a beam of electrically charged particles (24) in the beam path of imaging systems, more particularly in mass spectrometers (10), is indicated, the lens arrangement (30) being connected to an electrical voltage supply. The lens arrangement (30) is situated at the location or in the vicinity of the intermediate image (29) produced by the imaging system, and consists of a plurality of plates (32 to 35) disposed in succession, with aligned transmission apertures (38 to 41), the plates being connected to adjustable electrical voltages.

REFERENCES:
patent: 3138733 (1964-06-01), Smith
patent: 3585384 (1971-06-01), Castaing et al.
patent: 3745343 (1973-07-01), Halliday et al.
patent: 3814936 (1974-06-01), Green
patent: 4418280 (1983-11-01), Matsuda
patent: 4638160 (1987-01-01), Slodzian et al.
"Design and Performance of an Energy-and Angle-Resolved Secondary Ion Mass Spectrometer," by R. A. Gibbs and N. Winograd, 1148-55, Rev. Sci. Instrum. 52(8), Aug. 1981.

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