Length standard comparison method and apparatus utilizing hologr

Optics: measuring and testing – By particle light scattering – With photocell detection

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356358, G01B 902

Patent

active

041970101

ABSTRACT:
A hologram of a wave front reflected by the end of a primary standard, either produced by exposure of a plate in the apparatus or synthesized by computer, is illuminated by a laser with a direct beam and with a beam reflected from the end of a standard to be measured mounted in a reference position. Interference fringes are produced on a screen and the standard to be measured is moved from a reference position to a position in which the reflected wave front coincides with the wave front recorded by the hologram while the fringes are counted to determine the difference in length.

REFERENCES:
patent: 3592548 (1971-07-01), Majkowski
patent: 3721498 (1973-03-01), Narodny
patent: 3938889 (1976-02-01), McKinnis

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