Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1985-03-21
1986-12-23
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
250237G, 340347P, G01B 702
Patent
active
046309284
ABSTRACT:
In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90.degree., to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90.degree. and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached.
REFERENCES:
patent: 4225931 (1980-09-01), Schwefel
patent: 4306220 (1981-12-01), Schwefel
patent: 4547667 (1985-10-01), Sasaki et al.
Gruhler Siegfried
Klingler Otto
Mauser-Werke Oberndorf GmbH
Rosenberger R. A.
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