LED and PIN diode characterization by producing a schematic prof

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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350 9615, H01J 516, H01J 4014

Patent

active

048088161

ABSTRACT:
A method and apparatus for characterizing light emitting diodes (10) and PIN diodes (100) for coupled power degradation with varying offset is disclosed. An optical-electronic device such as a light emitting diode (10) or PIN diode (100) is scanned by an optical fiber (20) to obtain the output intensity of the LED (10) or the detection sensitivity of the PIN diode (100) as a function of position.

REFERENCES:
patent: 4452506 (1984-06-01), Reeve et al.
patent: 4474423 (1984-10-01), Bisbee et al.
patent: 4521688 (1985-06-01), Yin
patent: 4525858 (1985-06-01), Cline et al.
patent: 4545643 (1985-10-01), Young et al.
patent: 4594001 (1986-06-01), DiMatteo et al.
patent: 4634275 (1987-01-01), Yoshida et al.
patent: 4653905 (1987-03-01), Farrar et al.
patent: 4678271 (1987-07-01), Beaulieu
patent: 4684883 (1987-08-01), Ackerman et al.
patent: 4687325 (1987-08-01), Corby, Jr.

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