Learning classifiers for multiple-label data analysis

Data processing: artificial intelligence – Machine learning

Reexamination Certificate

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Reexamination Certificate

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08055593

ABSTRACT:
A method for multiple-label data analysis includes: obtaining labeled data points from more than one labeler; building a classifier that maximizes a measure relating the data points, labels on the data points and a predicted output label; and assigning an output label to an input data point by using the classifier.

REFERENCES:
patent: 5768333 (1998-06-01), Abdel-Mottaleb
patent: 5857030 (1999-01-01), Gaborski et al.
patent: 6125194 (2000-09-01), Yeh et al.
patent: 7474775 (2009-01-01), Abramoff et al.
patent: 7783585 (2010-08-01), Sabe et al.
patent: 2005/0187892 (2005-08-01), Goutte et al.
patent: 2008/0301077 (2008-12-01), Fung et al.
patent: 2009/0125461 (2009-05-01), Qi et al.
Lam, Chuck P. and Stork, David G.; “Toward Optimal Labeling Strategy under Mulitple Unreliable Labelers”; Dec. 1, 2005; American Association for Artificial Intelligence; pp. 1-6.
Zhu, Shenghou et al.; “Multi-labelled Classification Using Maximum Entropy Method”; 2005; ACM; pp. 1-8.
Richardson, Matthew and Domingos, Pedro; “Learning with Knowledge from Multiple Experts”; 2003; AAAI Press; pp. 1-8.
Ghamrawi, Nadia and McCallum, Andrew; “Collective Multi-Label Classification”; 2005; ACM; pp. 195-200.
Donmez, Pinar et al.; “A Probabilistic Framework to Learn from Multiple Annotators with Time-Varying Accuracy”; pp. 1-12.
Donmez, Pinar et al.; “Efficiently Learning the Accuracy of Labeling Sources for Selective Sampling”; 2009; ACM; pp. 259-268.
Taskar, Ben et al.; “Max-Margin Markov Networks”; 2003; MIT Press; pp. 1-8.
Boutell, et al.; “Learning multi-label scene classification”; 2004; Pattern Recognition 37; pp. 1757-1771.
Brodley et al.; “Identifying and eliminating mislabeled training instances”; 1996; Thirtheenth National Conference on Artificial Intelligence; Aug. 1996; pp. 799-805 (1-7).
Friedman et al.; “Additive Logistic Regression: A Statistical View of Boosting”; 2000; The Annals of Statistics 200, vol. 28, No. 2; pp. 337-345.
Ho et al.; “Decision Combination in Multiple Classifier Systems”; 1994; IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 16, No. 1; pp. 66-75.
MacKay, David J. C.; “Information-based objective functions for active data selection”; 1992; MIT Press; Neural Computation, 4; pp. 590-604 (1-14).
Jin, Rong et al.; “Learning with Multiple Labels”; 2002; MIT Press; Advances in Neural Information Processing Systems 15: Proceedings of the 2002 Conference; 8 pages.
Belkin, Mikhail et al.; “Regularization and Semi-supervised Learning on Large Graphs”; 2004; Lecture Notes in Computer Science, vol. 3120/2004; pp. 624-638.
Rifkin, Ryan M. et al.; “Notes on Regularized Least Squares”; 2007; MIT; MIT-CSAIL-TR-2007-025; pp. 1-8.
Dawid, et al., “Maximum Likelihood Estimation Observer Error-Rates Using EM Algorithm”, 2005, American Association for Artificial Intelligence, pp. 1-6.
Jin, et al., “Learning with Multiple Labels”, 2002, Advances in Neural Information Processing Systems (NIPS), pp. 1-8.

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