Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-09-19
2006-09-19
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S065000, C324S510000, C324S551000
Reexamination Certificate
active
07110895
ABSTRACT:
A method for measuring the resistance component current included in the leakage current is provided. In a monitoring apparatus and system for measurement the signal waveform of at least one AC cycle is sampled. The resistance component leakage current is measured by dividing the average of integrated value of the instantaneous leakage current values and the instantaneous voltage values by the square root of average of squared instantaneous voltage values. In addition, a voltage signal of the target measurement circuit is obtained the waveform of the leakage current signal and the voltage signal for one cycle is sampled and stored; the leakage current signal and the voltage signal are expanded to N-th higher harmonic wave component respectively, and the resistance component that relates to the leakage current is calculated.
REFERENCES:
patent: 3732490 (1973-05-01), Bolka
patent: 6072708 (2000-06-01), Fischer
patent: 6327124 (2001-12-01), Fearing et al.
patent: 6421618 (2002-07-01), Kliman et al.
patent: 6593751 (2003-07-01), Takahashi
Sakai Kuniyoshi
Takakamo Naohiro
Terakami Yoshikazu
Hitachi , Ltd.
Hoff Marc S.
Suglo Janet L
Townsend and Townsend / and Crew LLP
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