Semiconductor device manufacturing: process – With measuring or testing – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2007-01-02
2007-01-02
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Packaging or treatment of packaged semiconductor
Reexamination Certificate
active
11138491
ABSTRACT:
A leadframe for multi-chip package (MCP) including a die pad and a plurality of leads. A dielectric layer is formed on the lower surface of the die pad, so that the die pad is etched to form an interconnecting conductor with a bonding region. An insulation layer is formed on the interconnecting conductor and exposes the bonding region, so that a chip or a passive component can be electrically connected to the leads via the interconnecting conductor.
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patent: 2002/0192859 (2002-12-01), Akram
patent: 2004/0198022 (2004-10-01), Alvarez
Advanced Semiconductor Engineering Inc.
Bacon & Thomas PLLC
Lebentritt Michael
Stevenson Andre′ C.
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