Lead inspection method using a plane of light for producing refl

Details Lead inspection method using a plane of light for producing refl Lead inspection method using a plane of light for producing refl

1992-05-04

1993-05-18

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356376, 29705, G01V 904

Patent

active

052123901

ABSTRACT:
Light (19) is projected at an incidence angle (29) onto a plurality of leads (12, 13). The light (19) is simultaneously reflected from each of the plurality of leads (12, 13). The light that is simultaneously reflected (24, 26) from each lead (12, 13) is detected. A cotangent function of the incidence angle (29) is utilized to detect an amount of displacement (32) of at least one of the plurality of leads.

REFERENCES:
patent: 4696047 (1987-09-01), Christian et al.
patent: 4741621 (1988-05-01), Taft et al.
patent: 4874956 (1989-10-01), Kato et al.
patent: 5012524 (1991-04-01), LeBeau
patent: 5102224 (1992-04-01), Uesugi et al.
Petros Maragos; "Tutorial on Advances in Morphological Image Processing and Analysis,"; Optical Engineering, vol. 26, No. 7, pp. 623-632; Jul. 1987.

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