Measuring and testing – Inspecting
Patent
1997-09-18
1998-04-21
Williams, Hezron E.
Measuring and testing
Inspecting
340674, 198340, G01M 1900
Patent
active
057419884
ABSTRACT:
In a lead frame detection device used between a bonding machine and a lead frame storage magazine, a lead frame contacting probe is provided on a pivotal contact assembly so that the pivotal movement of the contact assembly that is caused, via the contacting probe, by the thickness of the lead frame(s) is detected by sensors, thus determining the existence or absence of the lead frame(s) on the lead frame guide rails, and, in the case of existence, the number of lead frames on the guide rails.
REFERENCES:
patent: 4476743 (1984-10-01), Kimura
patent: 5041721 (1991-08-01), Smith et al.
patent: 5208464 (1993-05-01), Yonemoto et al.
patent: 5220997 (1993-06-01), Ushiki et al.
patent: 5474228 (1995-12-01), Sato
patent: 5562382 (1996-10-01), Miyoshi
Translation of Abstract JP 55-12747.
Kikuchi Eiji
Kobayashi Takashi
Fayyaz Nashmiya
Kabushiki Kaisha Shinkawa
Williams Hezron E.
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