Layout of an image sensor for increasing photon induced current

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

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257257, 257258, 257465, 257654, H01L 27148, H01L 29768, H01L 2980, H01L 31112, H01L 31288

Patent

active

061473723

ABSTRACT:
Device layouts are described which increase the photon current of a metal oxide semiconductor image sensor. The metal oxide semiconductor can be NMOS, PMOS, or CMOS. The key part of the photon current of the image sensors comes from the depletion region at the PN junction between the drain region and the substrate material. The layouts used significantly increase the area of this depletion region illuminated by a stream of photons. The layouts have a drain region which takes the shape of a number of parallel fingers perpendicular to the gate electrode, a number of parallel fingers parallel to the gate electrode, or a spiral. The drain regions of these layouts significantly increase the area of the drain depletion region illuminated by a stream of electrons.

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