Layout of a vertical pattern used in dipole exposure apparatus

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C430S030000

Reexamination Certificate

active

07427456

ABSTRACT:
A layout of vertical patterns in a mask used in a dipole exposure apparatus employing a dipole as an aperture, including the vertical patterns disposed vertically to the dipole, and tabs, having critical dimensions broader than those of the vertical patterns, crossing edges of the vertical patterns. The tabs having critical dimensions broader than those of the vertical patterns are additionally inserted into the edges of the vertical patterns disposed vertically to the dipole, thereby minimizing the difference in critical dimensions between central and edge portions of the vertical patterns so that the vertical patterns maintain uniform fine critical dimensions.

REFERENCES:
patent: 6121073 (2000-09-01), Huang et al.
patent: 6307213 (2001-10-01), Huang et al.
patent: 6553562 (2003-04-01), Capodieci et al.
patent: 6613612 (2003-09-01), Park
patent: 6915505 (2005-07-01), Hsu et al.
patent: 7022438 (2006-04-01), Kim
patent: 2004/0142251 (2004-07-01), Hsu et al.
patent: 07-181668 (1995-07-01), None
patent: 1020030038419 (2003-05-01), None
patent: 1020030043443 (2003-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Layout of a vertical pattern used in dipole exposure apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Layout of a vertical pattern used in dipole exposure apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Layout of a vertical pattern used in dipole exposure apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3987925

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.