Layered microelectronic contact and method for fabricating same

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Ball or nail head type contact – lead – or bond

Reexamination Certificate

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Details

C257S773000, C029S842000

Reexamination Certificate

active

07005751

ABSTRACT:
A microelectronic spring contact for making electrical contact between a device and a mating substrate and method of making the same are disclosed. The spring contact has a compliant pad adhered to a substrate of the device and spaced apart from a terminal of the device. The compliant pad has a base adhered to the substrate, and side surfaces extending away from the substrate and tapering to a smaller end area distal from the substrate. A trace extends from the terminal of the device over the compliant pad to its end area. At least a portion of the compliant pad end area is covered by the trace, and a portion of the trace that is over the compliant pad is supported by the compliant pad. A horizontal microelectronic spring contact and method of making the same are also disclosed. The horizontal spring contact has a rigid trace attached at a first end to a terminal of a substrate. The trace is free from attachment at its second end, and extends from the terminal in a direction substantially parallel to a surface of the substrate to the second end. At least a distal portion of the trace extending to the second end is spaced apart from the surface of the substrate. The spaced-apart distal portion is flexible in a plane parallel to the substrate.

REFERENCES:
patent: 3881799 (1975-05-01), Elliott et al.
patent: 4466184 (1984-08-01), Cuneo et al.
patent: 5090118 (1992-02-01), Kwon et al.
patent: 5092782 (1992-03-01), Beaman
patent: 5109596 (1992-05-01), Driller et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5177438 (1993-01-01), Littlebury et al.
patent: 5187020 (1993-02-01), Kwon et al.
patent: 5465611 (1995-11-01), Ruf et al.
patent: 5476818 (1995-12-01), Yanof et al.
patent: 5629137 (1997-05-01), Leedy
patent: 5812378 (1998-09-01), Fjelstad et al.
patent: 5864946 (1999-02-01), Eldridge et al.
patent: 6031282 (2000-02-01), Jones et al.
patent: 6059982 (2000-05-01), Palagonia et al.
patent: 6204455 (2001-03-01), Gilleo et al.
patent: 6351885 (2002-03-01), Suzuki et al.
patent: 6499216 (2002-12-01), Fjelstad
patent: 6659778 (2003-12-01), Li
patent: 6672876 (2004-01-01), Takekoshi
patent: 2003/0019836 (2003-01-01), Clements et al.
patent: 2003/0067755 (2003-10-01), Pohl et al.
patent: 10 239 080 (2004-11-01), None
patent: 6-018555 (1994-01-01), None
patent: 6-313775 (1994-08-01), None
patent: 6-265575 (1994-09-01), None
patent: 7-333232 (1995-12-01), None
Leung, et al., “Active Substrate Membrane Probe Card”, Technical Digest of the International Electron Devices Meeting (IEDM), pp. 709-712, (Oct. 12, 1995).
Kong et al., “Interated Electrostatically Resonant Scan Tip for an Atomic Force Microscope”, Journal of Vacuum Science & Technology B, vol. 11, No. 3, pp. 634-641, Jun. 1993.

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