Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2007-01-10
2010-06-15
Nguyen, Sang (Department: 2886)
Optics: measuring and testing
By polarized light examination
C356S389000, C356S237100, C356S239100
Reexamination Certificate
active
07738102
ABSTRACT:
Provided are a layered film defect detection device capable of performing defect detection considering irregularities of optical performance of a phase difference layer constituting the layered film without requiring insertion of a new part into an optical path; and a layered film defect detection method. A defect detection device used for a layered film (11) having a polarizing plate (1) and a phase difference layer (separator (2)) includes: a light source (12) arranged at one side of the film surfaces of the layered film (11), an imaging unit (13) arranged on the other side of the film surface; an inspection polarization filter (15) arranged between the light source (12) and the imaging unit (13); a defect detection unit (14b) for detecting a defect existing on the polarizing plate (1) according to the captured image; and an optical axis adjusting unit (16) for adjusting a relative angle position of the polarization axis (L2) of a polarizing filter (15) and a polarization axis (L1) of a polarizer (2). In the detection device, the relative angle position of the polarizing filter (15) is adjusted within a range of the polarization axis angle x of the polarizing filter satisfying the relationship 0 degrees<xf 15 degrees so as to minimize the visible light quantity inputted to the imaging unit.
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International Search Report of PCT/JP2007/050119, date of mailing April 24, 2007.
Notification of Transmittal of Copies of Translation of the International Preliminary Report on Patentability (Form PCT/IB/338) of International Application No. PCT/JP2007/050119 mailed Jul. 24, 2008 with Forms PCT/IB/373, PCT/IB/326, PCT/ISA/237 and English translation of PCT/ISA/237.
Kobayashi Takamasa
Mikasa Yasuyuki
Shikami Masaki
Nguyen Sang
Nitto Denko Corporation
Westerman Hattori Daniels & Adrian LLP
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