Adhesive bonding and miscellaneous chemical manufacture – Methods – Surface bonding and/or assembly therefor
Reexamination Certificate
2007-01-10
2010-12-14
Wyrozebski, Kat (Department: 1791)
Adhesive bonding and miscellaneous chemical manufacture
Methods
Surface bonding and/or assembly therefor
C156S378000, C156S379000, C356S239100, C356S239200, C356S237600, C356S432000, C356S433000, C356S434000, C349S074000, C349S075000, C349S076000, C349S117000, C349S118000, C349S119000, C349S120000
Reexamination Certificate
active
07850801
ABSTRACT:
A defect detection method of a layered film having a polarizing plate and an optical compensation layer includes steps of: applying light from a light source arranged at the polarizing plate layer side of the film surface of the layered film; a step of imaging a transmitting light image of the layered film by an imaging unit arranged at the optical compensation layer side of the film surface; and a defect detection step for detecting a defect existing on the layered film according to the transmitting light image captured by the imaging unit. The imaging unit performs imaging via an inspection polarizing filter arranged on the optical path between the light source and the imaging unit and adjacent to the imaging unit; and an inspection phase difference filter arranged on the optical path between the light source and the imaging unit and between the inspection polarizing filter and the layered film.
REFERENCES:
patent: 6034754 (2000-03-01), Sato et al.
patent: 6650410 (2003-11-01), Shimoda
patent: 2003/0103186 (2003-06-01), Sasaki et al.
patent: 2004/0125375 (2004-07-01), Some
patent: 2009/0009864 (2009-01-01), Kobayashi et al.
patent: 1412582 (2003-04-01), None
patent: 2001-159582 (2001-06-01), None
patent: 2001-324453 (2001-11-01), None
patent: 2005-9919 (2005-01-01), None
patent: 2005-337814 (2005-12-01), None
International Search Report of PCT/JP2007/050121, date of mailing Apr. 17, 2007.
Notification of Transmittal of Translation of the International Preliminary Report on Patentability (Form PCT/IB/338) of International Application No. PCT/JP2007/050121 mailed Jul. 24, 2008 with Forms PCT/IB/373, PCT/IB/326, PCT/ISA/237 and English translation of PCT/ISA/237.
Chinese Office Action dated Jul. 14, 2010, issued in corresponding Chinese Patent Application No. 200780001727.
Hagiwara Michihiro
Kobayashi Takamasa
Shizen Kouji
Yano Yuuki
Nitto Denko Corporation
Rivera Joshel
Westerman Hattori Daniels & Adrian LLP
Wyrozebski Kat
LandOfFree
Layered film fabrication method, layered film defect... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Layered film fabrication method, layered film defect..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Layered film fabrication method, layered film defect... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4213717