Geometrical instruments – Distance measuring – By flexible tape
Reexamination Certificate
2006-11-03
2010-06-08
Smith, R. A. (Department: 2841)
Geometrical instruments
Distance measuring
By flexible tape
Reexamination Certificate
active
07730630
ABSTRACT:
A new and improved tape rule that increases stiffness and standout length over standard tape rules is disclosed. The tape rule includes a primary rule and a secondary rule, the secondary rule providing increased strength. This invention can provide a variety of benefits, including increased blade flexibility while performing short extension related tasks, increased standout and reduced sag while performing tasks requiring longer extensions, reduced size and weight for tasks requiring the longest extensions and adds the ability to utilize alternate measurement methods or units and built in computational references.
REFERENCES:
patent: 1713891 (1929-05-01), Dooley
patent: 2307395 (1943-01-01), Dinhofer
patent: 2319724 (1943-05-01), Dinhofer
patent: 2795050 (1957-06-01), Van Fleet
patent: 2835038 (1958-05-01), Perrin
patent: 2920394 (1960-01-01), Soderbergh
patent: 3242578 (1966-03-01), Moll
patent: 4275503 (1981-06-01), Bergkvist
patent: 4827622 (1989-05-01), Makar
patent: 5016360 (1991-05-01), Starcevich
patent: 6497050 (2002-12-01), Ricalde
patent: 6510622 (2003-01-01), Laughlin et al.
patent: 7062862 (2006-06-01), Wheaton
patent: 2003/0154617 (2003-08-01), Ricalde
patent: 2216870 (1989-10-01), None
patent: 56104201 (1981-08-01), None
patent: 2008026094 (2008-02-01), None
patent: 2009162764 (2009-07-01), None
patent: WO 2007076568 (2007-07-01), None
Fleming Heather
Lamb Brian
Titzler David
Design to Manufacturing, Inc.
Schox Jeffrey
Smith R. A.
LandOfFree
Layered beam measurement apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Layered beam measurement apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Layered beam measurement apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4203561