Layer transfer process and functionally enhanced integrated...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21499

Reexamination Certificate

active

07855101

ABSTRACT:
A structure for a semiconductor components is provided having a device layer sandwiched on both sides by other active, passive, and interconnecting components. A wafer-level layer transfer process is used to create this planar (2D) IC structure with added functional enhancements.

REFERENCES:
patent: 4939568 (1990-07-01), Kato
patent: 5250460 (1993-10-01), Yamagata et al.
patent: 5277748 (1994-01-01), Sakaguchi et al.
patent: 5405802 (1995-04-01), Yamagata et al.
patent: 5679475 (1997-10-01), Yamagata et al.
patent: 5856229 (1999-01-01), Sakaguchi
patent: 6100165 (2000-08-01), Sakaguchi
patent: 6121112 (2000-09-01), Sakaguchi et al.
patent: 6140209 (2000-10-01), Iwane
patent: 6150239 (2000-11-01), Goesele
patent: 6190937 (2001-02-01), Nakagawa
patent: 6211038 (2001-04-01), Nakagawa et al.
patent: 6258698 (2001-07-01), Iwasaki
patent: 6306729 (2001-10-01), Sakaguchi
patent: 6309945 (2001-10-01), Sato
patent: 6320228 (2001-11-01), Yu
patent: 6350702 (2002-02-01), Sakaguchi
patent: 6661098 (2003-12-01), Magerlein
patent: 6732908 (2004-05-01), Furman
patent: 6765301 (2004-07-01), Wu
patent: 6819000 (2004-11-01), Magerlein
patent: 7042753 (2006-05-01), Horiguchi
patent: 7190068 (2007-03-01), Hackitt
patent: 7622363 (2009-11-01), Yonehara et al.
patent: 2003/0060034 (2003-03-01), Beyne et al.
patent: 2008/0272497 (2008-11-01), Lake
Auberton-Herve et al., “SMART-CUT® : The basic fabrication process for UNIBOND® SOI wafers”, Mat. Res. Soc. Symp. Proc., vol. 446, pp. 177-186 (1997) or IEEE Trans Electron Devices, Mar. 1997.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Layer transfer process and functionally enhanced integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Layer transfer process and functionally enhanced integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Layer transfer process and functionally enhanced integrated... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4191368

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.