Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1989-08-03
1990-09-04
McGraw, Vincent P.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356354, G01B 902
Patent
active
049539817
ABSTRACT:
A lateral-shearing electro-optic field sensor in which a lateral-shearing terferometer is used in conjunction with an electro-optic crystal and a coherent light source to measure the waveform of an electro-magnetic pulse or a microwave pulse in free space. Depending on the size of the electro-optic crystal used, the device is adapted to measure frequencies as high as 20 GHz.
REFERENCES:
patent: 2679183 (1954-05-01), Buchele et al.
patent: 4595876 (1986-06-01), Kuhara et al.
Bush Freddie M.
Deaton James T.
McGraw Vincent P.
The United States of America as represented by the Secretary of
Turner S. A.
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