Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Including diode
Reexamination Certificate
2011-05-03
2011-05-03
Menz, Douglas M (Department: 2891)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Including diode
C438S236000
Reexamination Certificate
active
07935605
ABSTRACT:
In an ESD protection circuit an NPN BJT snapback device is provided with high breakdown voltage by including a RESURF region or by forming a PIN diode in the BJT. Holding voltage is increased by forming a sub-collector sinker region with the desired configuration.
REFERENCES:
patent: 7180158 (2007-02-01), Khemka et al.
Hopper Peter J.
Vashchenko Vladislav
Menz Douglas M
National Semiconductor Corporation
Vollrath Jurgen K.
Vollrath & Associates
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