Lateral calibration device and method

Details Lateral calibration device and method Lateral calibration device and method

2007-07-24

2007-07-24

Raevis, Robert (Department: 2856)

Measuring and testing

Instrument proving or calibrating

Displacement, motion, distance, or position

Reexamination Certificate

active

11259642

ABSTRACT:
A calibration device and method for lateral force calibration in small force measuring devices such as atomic force microscopes is disclosed. A platform has a substantially planar surface including a slot for accommodating at least part of the AFM cantilever tip, one or more supporting legs arranged to provide sprung resistance to the platform and a capacitive drive means for driving the platform laterally with respect to the AFM cantilever tip.

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patent: 2003/0200785 (2003-10-01), Platt
patent: 2005/0241364 (2005-11-01), Fujiyoshi et al.
patent: 2006/0005603 (2006-01-01), Chau et al.
patent: 2 401 945 (2004-11-01), None
patent: WO-2004/104516 (2004-12-01), None

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