Latch-up prevention in a two-power-supply CMOS integrated circui

Electrical transmission or interconnection systems – Nonlinear reactor systems – Parametrons

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3072962, 307570, H03K 301

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active

048719277

ABSTRACT:
Latch-up in two supplies (+VCC and -VBB) CMOS integrated circuits is prevented by means of a single integrated protection MOS transistor, N-channel for P-Well CMOS or P-channel for N-Well CMOS, having its drain (source) connected to ground and its body region, gate and source (drain) connected to -VBB (+VCC). The desired threshold voltage and dimensions of the protection transistor do not present particular problems of implementation.

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patent: 4670669 (1987-06-01), Cottrell et al.
patent: 4723081 (1988-02-01), Akatsuka
A. H. Taber, "Circuit Technique to Help Prevent CMOS Latch-Up", IBM, vol. 26, No. 10A, Mar. 1984.
"Prevent of CMOS Circuit Latch-Up", IBM, vol. 29, No. 5, 1986.
J. Lipman "Latchup Prevention in Bulk P-Well CMOS Circuit", VLSI Design, May/Jun. 1982.

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