Latch circuit tolerant to single event transient

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Particular stable state circuit

Reexamination Certificate

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Details

C327S208000, C327S210000, C327S212000, C327S218000

Reexamination Certificate

active

07982515

ABSTRACT:
A latch circuit has: a data input unit to which an input data is input; and a data retention unit including a node connected to the data input unit. The data input unit transmits a data depending on the input data to the node, when both of a first clock signal and a second clock signal that are driven independently from each other are at a first level. The data retention unit holds a data at the node, when at least one of the first clock signal and the second clock signal is at a second level that is an inverted level of the first level.

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P. Hazucha, et al. “Measurement and analysis of SER tolerant latch in a 90 nm dual-Vt CMOS process”, IWWW 2003 Custom Integrated Circuits Conference, pp. 917-620, 2003.
M. J. Myjak, et al., “Enhanced Fault-Tolerant CMOS Memory Elements”, The 47th IEEE International Midwest Symposium on Circuits and Systems, pp. 1-453-456, 2004.

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