Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-12-06
2009-10-20
Turner, Samuel A (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S432000
Reexamination Certificate
active
07605924
ABSTRACT:
An inspection system is provided to examine internal structures of a target material. This inspection system combines an ultrasonic inspection system and a thermographic inspection system. The thermographic inspection system is attached to ultrasonic inspection and modified to enable thermographic inspection of target materials at distances compatible with laser ultrasonic inspection. Quantitative information is obtained using depth infrared (IR) imaging on the target material. The IR imaging and laser-ultrasound results are combined and projected on a 3D projection of complex shape composites. The thermographic results complement the laser-ultrasound results and yield information about the target material's internal structure that is more complete and more reliable, especially when the target materials are thin composite parts.
REFERENCES:
patent: 4896278 (1990-01-01), Grove
patent: 6122060 (2000-09-01), Drake, Jr.
patent: 6516084 (2003-02-01), Shepard
patent: 6684701 (2004-02-01), Dubois et al.
patent: 6712502 (2004-03-01), Zalameda et al.
patent: 7095505 (2006-08-01), Beard et al.
patent: 2004/0154402 (2004-08-01), Drake, Jr.
Drake Thomas E.
Dubois Marc
Howard Donald Robert
Richter Timothy Gerard
Ringermacher Harry Israel
Bracewell & Giuliani LLP
Lockheed Martin Corporation
Turner Samuel A
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