Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1980-02-28
1982-08-24
Karlsen, Ernest F.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324 62, 324158D, G01R 3126, G01R 2702
Patent
active
043463487
ABSTRACT:
A method for accurately determining the compensation density of n-type naw-gap semiconductors. A semiconductor sample is irradiated with laser pulses of a particular density and pulse width for a particular time length with the sample maintained at a low temperature to generate photo-excited carriers within the semiconductor sample. Photons of energy less than the energy gap, E.sub.g, but greater than, E.sub.g /2, generate carriers uniformly throughout the semiconductor via the nonlinear mechanism of two-photon absorption. Photo-Hall measurements are made on the semiconductor sample during and after the laser pulse to determine the mobility, .mu., and carrier density, n, as a function of time using suitable equipment such as a computer controlled digital processing oscilloscope to display the curves. The curves displayed by the oscilloscope are compared with previously calculated curves to obtain a match and thereby determine the quality of the sample. By combining measurements of the Hall effect and conductivity, one can deduce the carrier densities and mobilities as well as other various quantities by well-known formulas.
REFERENCES:
patent: 4217547 (1980-08-01), Bartoli et al.
Bartoli Filbert J.
Meyer Jerry R.
Beers Robert F.
Crane Melvin L.
Ellis William T.
Karlsen Ernest F.
The United States of America as represented by the Secretary of
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