Laser system for the ionization of a sample by...

Details Laser system for the ionization of a sample by... Laser system for the ionization of a sample by...

2007-06-26

2007-06-26

Nguyen, Kiet T. (Department: 2881)

Radiant energy

Ionic separation or analysis

With sample supply means

Reexamination Certificate

active

11226855

ABSTRACT:
The invention relates to a laser system for the ionization of a sample by matrix-assisted laser desorption in mass spectrometric analysis. The invention consists in providing a laser system which generates a spatially modulated intensity distribution with intensity spots on the sample, which significantly improves the quality and the robustness of the mass spectrometric analysis compared with a spatially homogeneous intensity distribution and, in particular, improves the ionization efficiency and, for a time-of-flight mass spectrometer with axial injection, the mass resolution and the signal-to-noise ratio.

REFERENCES:
patent: 5365063 (1994-11-01), Kaesdorf et al.
patent: 6956208 (2005-10-01), Reilly et al.
patent: 2003/0025074 (2003-02-01), Li
patent: 2003/0155499 (2003-08-01), Axelsson
patent: 198 34 070 (1998-07-01), None
patent: 101 12 386 (2001-03-01), None
patent: 2 149 569 (1985-06-01), None
patent: WO 01/93308 (2001-12-01), None
patent: WO 2005/079360 (2005-09-01), None
Rohrbacher et al., “Multiple-ion-beam time-of-flight mass spectrometer”, Review of Scientific Instruments, vol. 72, No. 8, American Institute of Physics, pp. 3386-3389, 2001.
Dreisewerd, Klaus, “The Desorption Process in MALDI”, Chemical Reviews, pp. A-AE, 2002.

Affiliated with

Also associated with

Rating

Laser system for the ionization of a sample by... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Laser system for the ionization of a sample by..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Laser system for the ionization of a sample by... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3885361