Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-02-21
1996-12-31
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356373, 356400, 25055929, G01B 1100, G01C 500
Patent
active
055899390
ABSTRACT:
Disclosed is a laser surveying system in which devices installed at measuring points are inexpensive and small in weight, and a distribution of codes is not needed for transmitting positional data obtained, this system being capable of continuously quickly making a three-dimensional measurement of the displacement. When the laser beam projected from a light projector sweeps a reflecting device on an object, reflecting surfaces supply the laser beam with positional data. A displacement of the object is measured based on the transmitted positional data from the reflected laser beam.
REFERENCES:
patent: 4997283 (1991-03-01), Danielson et al.
patent: 5251013 (1993-10-01), Danielson et al.
Evans F. L.
Nikon Corporation
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